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Posted

This is a image of an integrated circuit die. Notice that there are (almost) black lines bordering differently doped regions of semiconductor devices (transistors, diodes and resistors) with silver colored metal contacts and interconnects. What i would like to do is extract only these "black lines" and just "white out" everything else. If you look close at the corners of these lines you see they are rounded. Secondly, I would like to measure the radius of these rounded corners and if anyone knows an easy way to do this in software please let me know. Corner radius size is what I ultimately want because it varies with diffusion depth of dopants in the various n-type and p-type aspects of the silicon.

 

1625635138_LM360_full25percentscale.thumb.jpg.ab8365e730566484e960d4fccb4b177e.jpg

Posted

Here is a tutorial for a technique and also a plugin. Honestly, results are probably going to disappoint.

 

It might be faster and more accurate to trace over the lines you want using the rounded rectangle shape. Do the tracing in a contrasting color on a new layer. If you use a brush width of three and a corner size of four you'll get quite close.

 

tracing.gif

Posted (edited)
13 hours ago, Ego Eram Reputo said:

Here is a tutorial for a technique and also a plugin. Honestly, results are probably going to disappoint.

 

It might be faster and more accurate to trace over the lines you want using the rounded rectangle shape. Do the tracing in a contrasting color on a new layer. If you use a brush width of three and a corner size of four you'll get quite close.

 

 

 

Thanks! Yeah I was using CAD software to measure and trace lines. What I ended up settling on was using the blackened lines and looking where the straight edge starts to deviate at a corner and then measure the distance to the other perpendicular lines corresponding edge at that corner (note: the image below does it for the middle of the darkened line). The "eyeballing" of corner round tangent points to a straight line is one problem but I thought there maybe a better way which is a less subjective and more repeatable proceedure. A larger photo of each device would help a lot but that isn't available.

Screenshot (1829).png

Edited by mszlazak

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